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Authors: Luca Capua; Yann Sprunger; H. Elettro; F. Risch; A. Grammoustianou; R. Midahuen; T. Ernst; S. Barraud; R. Gill; A. M. Ionescu
Journal title: IEEE Transactions on Electron Devices
Journal number: 1
Journal publisher: IEEE
Published year: 2022
DOI identifier: 10.1109/ted.2022.3144108
ISSN: 1557-9646