Reliability analysis of high power LEDs for automotive: impact of current and temperature

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Authors: N.Trivellin,A. Caria, R.Fraccaroli, N.Roccato, M.Buffolo, C.De Santi, G.Meneghesso, E,Zanoi, M.Meneghini

Journal publisher: 35th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis

Published year: 2024