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Authors: Caria, R. Fraccaroli, G. Pierobon, T. Castellaro, A. Huang, C. De Santi, M. Buffolo, N. Trivellin, E. Zanoni, G. Meneghesso, M. Meneghini,
Journal title: ESREF 2024 - 35th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
Journal publisher: ESREF 2024 - 35th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
Published year: 2024