Robustness and reliability of high-power white LEDs under high-temperature, high-current stress

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Authors: Caria,A., Fraccaroli, R.,Pierobon, G., Castellaro, T., Mura, G., Ricci, P.C., De Santi, C., Buffolo, M., Trivellin, N., Zanoni, E., Meneghesso, G., Meneghini, M.

Journal title: Proc. SPIE 12906, Light-Emitting Devices, Materials, and Applications XXVIII, 129060T (13 March 2024)

Journal publisher: SPIE

Published year: 2024

DOI identifier: 10.1117/12.3005352