Hardware and software complex for conductometric measurements with high metrological reliability

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: V.G.Melnyk, S.V.Dzyadevych, P.I.Borshchov, V.K.Beliaev, O.D.Vasylenko, N.Jaffrezic-Renault

Journal title: Sensor Electronics and Мicrosystem Technologies

Journal number: 20 (3), P. 59-78 (2023)

Journal publisher: Odesa National University

Published year: 2023

Published pages: 59-78

DOI identifier: 10.18524/1815–7459.2023.3.288160

ISSN: 1815-7459