Optimization of Vertical GaN Drift Region Layers for Avalanche and Punch-Through Pn-Diodes

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Authors: E. Brusaterra, E. Bahat Treidel, F. Brunner, M. Wolf, A. Thies, J. Würfl, O. Hilt

Journal title: IEEE Electron Device Letters

Journal number: 44

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2024

Published pages: 388-391

DOI identifier: 10.1109/led.2023.3234101

ISSN: 0741-3106