Areal Vertical Transmission Line Model Measurement for Drift Region Characterization in Vertical GaN Based Devices

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Authors: E. Bahat Treidel, M. Wolf, F. Brunner, O. Hilt and J. Würfl

Journal title: Int. Conf. on Compound Semiconductor Manufacturing Technology (CS ManTech 2022)

Journal number: May 9-12, 2022

Journal publisher: CS ManTech

Published year: 2022

Published pages: 243-246