Isolation properties and failure mechanisms of vertical Pt / n-GaN SBDs

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Authors: M. Fregolent, M. Boito, A. Marcuzzi, C. De Santi, F. Chiocchetta, E. Bahat Treidel, M. Wolf, F. Brunner, O. Hilt, J. Würfl, G. Meneghesso, E. Zanoni, M. Meneghini

Journal title: Microelectronics Reliability

Journal number: 138

Journal publisher: Elsevier BV

Published year: 2023

Published pages: 114644

DOI identifier: 10.1016/j.microrel.2022.114644

ISSN: 0026-2714