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Authors: Claudia Morgado, Gisele Busichia Baioco, Tania Basso, Regina Moraes
Journal title: 2018 IEEE International Conference on Software Quality, Reliability and Security (QRS)
Journal publisher: IEEE
Published year: 2018
Published pages: 135-142
DOI identifier: 10.1109/QRS.2018.00027
ISBN: 978-1-5386-7757-5