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Authors: Georgios Koutalieris, Symeon Symeonidis, Iphigeneia Kapsomenaki, Maria João Feio, Luigi Esposito, Arriel Benis, Carina Dantas, Miriam Cabrita, Harm op den Akker, Oscar Tamburis
Journal title: 2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)
Journal number: 31
Journal publisher: IEEE
Published year: 2024
DOI identifier: 10.1109/MetroXRAINE58569.2023.10405595