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Authors: Tang, Hao; Shao, Ling; van Gool, Luc; Sebe, Nicu
Journal title: IEEE Transactions on Pattern Analysis and Machine Intelligence
Journal number: 46(6):4298-4313
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2024
DOI identifier: 10.1109/TPAMI.2024.3355248
ISSN: 0162-8828