Electronic structure calculations of defect states in Ti-doped LiF

Summary

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Authors: Guerda Massillon-Jl, Conrad S.N. Johnston, Lorenzo Stella, Jorge Kohanoff

Journal title: Radiation Measurements

Journal number: 174

Journal publisher: Elsevier BV

Published year: 2024

DOI identifier: 10.1016/j.radmeas.2024.107114

ISSN: 1350-4487