Investigation of <i>p</i>- and <i>n</i>-Type Quantum Dot Arrays Manufactured in 22nm FDSOI CMOS at 2-4 K and 300 K

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Authors: Shai Bonen, Suyash Pati Tripathi, Julie McIntosh, Thomas Jager, Sorin P. Voinigescu

Journal title: IEEE Electron Device Letters

Journal number: IEEE Electron Device Letters,

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2024

Published pages: 1-1

DOI identifier: 10.1109/led.2024.3435380

ISSN: 0741-3106