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Authors: T. Srivastava, H. Merbouche, I. Ngouagnia Yemeli, N. Beaulieu, J. Ben Youssef, M. Muñoz, P. Che, P. Bortolotti, V. Cros, O. Klein, S. Sangiao, J.M. De Teresa, S.O. Demokritov, V.E. Demidov, A. Anane, C. Serpico, M. d’Aquino, G. de Loubens
Journal title: Physical Review Applied
Journal number: 19
Journal publisher: American Physical Society
Published year: 2023
DOI identifier: 10.1103/physrevapplied.19.064078
ISSN: 2331-7019