Robustness and measurement-induced percolation of the surface code

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Authors: Botzung, Thomas; Buchhold, Michael; Diehl, Sebastian; Müller, Markus

Journal title: arXiv

Journal number: 2311

Journal publisher: Cornell Tech

Published year: 2023

Published pages: 14338

DOI identifier: 10.48550/arxiv.2311.14338