Determination of Bi₁₂SiO₂₀ permittivity and loss tangent in the 220–325 GHz band and the influence of UV exposure on these parameters

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Authors: Pawel Bajurko, Konrad Godziszewski, Yevhen Yashchyshyn, Dmytro Vynnyk, Volodymyr Haiduchok, Ivan Solskii

Journal title: 2020 IEEE 15th International Conference on Advanced Trends in Radioelectronics, Telecommunications and Computer Engineering (TCSET)

Journal number: 2

Journal publisher: IEEE

Published year: 2022

Published pages: 576-579

DOI identifier: 10.1109/tcset49122.2020.235498