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Authors: Olivia Zechner, Daniele Pretolesi, Emma Jaespert, Daniel Garcia, Manfred Tscheligi
Journal title: 2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering. Proceedings
Journal publisher: 2023 IEEE International Conference on Metrology for eXtended Reality
Published year: 2023
Published pages: 248-253
DOI identifier: 10.1109/metroxraine58569.2023.10405775
ISBN: 979-8-3503-0080-2