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Authors: Ying Zhang, Richard Koopmanschap, Martin Kersten
Journal title: 2018 IEEE 34th International Conference on Data Engineering (ICDE)
Journal publisher: IEEE
Published year: 2018
Published pages: 1672-1672
DOI identifier: 10.1109/icde.2018.00208
ISBN: 978-1-5386-5520-7
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