Variability and High Temperature Reliability ofGraphene Field-Effect Transistors with ThinEpitaxial CaF2 Insulators

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Authors: Yury Illarionov, Theresia Knobloch, Burkay Uzlu, Alexander Banshchikov, Illiya Ivanov, Viktor Sverdlov, Mikhail Vexler, Michael Waltl, Zhenxing Wang, Bibhas Manna, Daniel Neumaier, Max C. Lemme, Nikolai Sokolov, Tibor Grasser, Martin Otto, Stefanie Linda Stoll

Journal title: NPJ 2D MATERIALS AND APPLICATIONS

Journal publisher: Nature Portfolio

Published year: 2024

DOI identifier: 10.21203/rs.3.rs-3936684/v1

ISSN: 2397-7132