Standardization of breast CT imaging and dosimetry MC simulations using GATE

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Authors: G. Savvidis, A. Sarno, G. Mettivier, V. Paneta, V. Eleftheriadis, P. Russo, P. Papadimitroulas

Journal title: 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)

Journal publisher: IEEE

Published year: 2023

DOI identifier: 10.1109/nssmicrtsd49126.2023.10337988

ISBN: 979-8-3503-3866-9