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Authors: G. Mettivier, P. Papadimitroilas, T. Teneva, A. Sarno, N. Dukov, Z. Bliznakov, P. Russo, K. Bliznakova
Journal title: 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
Journal publisher: IEEE
Published year: 2023
DOI identifier: 10.1109/nssmicrtsd49126.2023.10338402
ISBN: 979-8-3503-3866-9