Edge-TCT evaluation of high voltage-CMOS test structures with unprecedented breakdown voltage for high radiation tolerance

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Authors: B. Wade M. Franks J. Hammerich N. Karim S. Powell E. Vilella C. Zhang

Journal title: Journal of Instrumentation

Journal publisher: Institute of Physics

Published year: 2022

DOI identifier: 10.1088/1748-0221/17/12/c12017

ISSN: 1748-0221