Trapping processes in vertical GaN Trench MOSFETs: from experimental analysis to simulations

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Authors: M. Fregolent, N. Zagni, C. De Santi, M. Buffolo, C. Huber, P. Pavan, G. Verzellesi, G. Meneghesso, E. Zanoni, M. Meneghini

Journal title: NanoInnovation 2024

Journal publisher: NanoInnovation

Published year: 2024