From Planar to Vertical GaN-on-Si Power Devices: Reliability Challenges to Efficient Power Conversion (Invited)

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Authors: Nicolò Zagni

Journal title: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

Journal publisher: IEEE

Published year: 2024

Published pages: 1-3

DOI identifier: 10.1109/edtm58488.2024.10511585