Investigation of Threshold Voltage Instability in GaN-on-Si Trench MOSFETs with SiO2 Gate Dielectric

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Authors: M. Fregolent, A. Del Fiol, C. De Santi, C. Huber, G. Meneghesso, E. Zanoni, M. Meneghini

Journal title: GaN Marathon 2024

Journal publisher: University Padoca, ACME

Published year: 2024