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Authors: Antonio Rubio, LongLong Yu, Edgar Simo-Serra, Francesc Moreno-Noguer
Journal title: 2016 23rd International Conference on Pattern Recognition (ICPR)
Journal publisher: IEEE
Published year: 2016
Published pages: 2824-2829
DOI identifier: 10.1109/ICPR.2016.7900064
ISBN: 978-1-5090-4847-2