Metrological robustness of high photon number optical cat states

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Authors: Stammer, Philipp; Martos, Tomás Fernández; Lewenstein, Maciej; Rajchel-Mieldzioć, Grzegorz

Journal title: arXiv.org

Journal publisher: Cornell University

Published year: 2023

DOI identifier: 10.48550/arxiv.2311.01371

ISSN: 2331-8422