Size Effect of Negative Capacitance State and Subthreshold Swing in Van der Waals Ferrielectric Field‐Effect Transistors

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Authors: Anna N. Morozovska, Eugene A. Eliseev, Yulian M. Vysochanskii, Sergei V. Kalinin, Maksym V. Strikha

Journal title: Advanced Electronic Materials

Journal publisher: Wiley

Published year: 2024

DOI identifier: 10.1002/aelm.202400495

ISSN: 2199-160X