On the Modeling of Polycrystalline Ferroelectric Thin Films: Landau-Based Models Versus Monte Carlo-Based Models Versus Experiment

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Authors: M. Thesberg, M. N. K. Alam, B. Truijen, B. Kaczer, P. J. Roussel, Z. Stanojević, O. Baumgartner, F. Schanovsky, M. Karner, H. Kosina

Journal title: IEEE TED Vol 69, n°6, 2022

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2022

DOI identifier: 10.1109/ted.2022.3167942

ISSN: 0018-9383