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Authors: Benjamin Schoch, Axel Tessmann, Arnulf Leuther, Sandrine Wagner, Ingmar Kallfass
Journal title: 2019 IEEE MTT-S International Microwave Symposium (IMS)
Journal publisher: IEEE
Published year: 2019
Published pages: 1249-1252
DOI identifier: 10.1109/mwsym.2019.8700754
ISBN: 978-1-7281-1309-8