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Authors: Emmanouil Pateromichelakis, Jens Gebert, Tomasz Mach, Jakob Belschner, Wei Guo, Nandish P. Kuruvatti, Venkatkumar Venkatasubramanian, Caner Kilinc
Journal title: IEEE Access
Journal publisher: Institute of Electrical and Electronics Engineers Inc.
Published year: 2017
Published pages: 1-1
DOI identifier: 10.1109/ACCESS.2017.2736579
ISSN: 2169-3536