Understanding the Electronic Transport of Al–Si and Al–Ge Nanojunctions by Exploiting Temperature-Dependent Bias Spectroscopy

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Authors: Raphael Behrle, Corban G. E. Murphey, James F. Cahoon, Sven Barth, Martien I. den Hertog, Walter M. Weber, Masiar Sistani

Journal title: ACS Applied Materials & Interfaces

Journal number: 16

Journal publisher: American Chemical Society

Published year: 2024

Published pages: 19350-19358

DOI identifier: 10.1021/acsami.3c18674

ISSN: 1944-8244