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Authors: K. L. Bober, V. Jungnickel, M. Emmelmann, M. Riegel, E. Tangdiongga, A.M.J. Koonen, J.-P. Linnartz, D. Behnke, M. Müller, P.-B. Bök, S. V. Colonques, M. M. Vazquez
Journal title: ICTON 2020
Journal publisher: IEEE
Published year: 2020