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Authors: Hao Tang, Guolei Sun, Nicu Sebe, Luc Van Gool
Journal title: IEEE Transactions on Pattern Analysis and Machine Intelligence
Journal number: 45
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2023
Published pages: 14435-14452
DOI identifier: 10.1109/tpami.2023.3298721
ISSN: 0162-8828