Investigation of De-embedding Techniques Applied on Uni-Traveling Carrier Photodiodes

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Authors: Dimitrios Konstantinou, Christophe Caillaud, Simon Rommel, Ulf Johannsen, Idelfonso Tafur Monroy

Journal title: 2020 50th European Microwave Conference (EuMC)

Journal publisher: IEEE

Published year: 2021

Published pages: 320-323

DOI identifier: 10.23919/eumc48046.2021.9338063

ISBN: 978-2-87487-059-0