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Authors: JF. Mainguet, A. J. Kronemeijer, G. H. Gelinck, M. Pouet, J.-Y. Fourre, S. Sinopoli, U. Emanuele, L. Fritsch, J. Liu Jimenez, J. Karlsson, F. De Roose, D. Gallaire, S. Steudel, A. Martinent, A. Revaux, M. Benwadih, S. Charlot, A. J. J. M van Breemen, J.- L. van der Steen, H. B. Akkerman
Journal title: 2019 IEEE International Electron Devices Meeting (IEDM)
Journal publisher: IEEE
Published year: 2019
Published pages: 26.5.1-26.5.4
DOI identifier: 10.1109/iedm19573.2019.8993475
ISBN: 978-1-7281-4032-2
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