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Authors: S. Lischke, A. Peczek, F. Korndörfer, C. Mai, H. Haisch, M. Koenigsmann, M. Rudisile, D. Steckler, F. Goetz, M. Fraschke, S. Marschmeyer, A. Krüger, Y. Yamamoto, D. Schmidt, U. Saarow, P. Heinrich, A. Kroh, M. Schubert, J. Katzer, P. Kulse, A. Trusch, L. Zimmermann
Journal title: IEEE International Electron Devices Meeting (IEDM), 2020
Journal publisher: IEEE
Published year: 2020
Published pages: pp. 7.3.1-7.3.4
DOI identifier: 10.1109/iedm13553.2020.9372033