Summary
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Authors: Vincent Wiaux, Natalia Davydova, Lieve Van Look, Nick Pellens, Ataklti Weldeslassie, Guillaume Libeert, Tatiana Kovalevich, Joost Bekaert, Frank Timmermans, Cyrus Tabery, Laura Huddleston
Journal title: Journal of Micro/Nanopatterning, Materials, and Metrology
Journal number: 24
Journal publisher: SPIE
Published year: 2025
DOI identifier: 10.1117/1.jmm.24.1.011012
ISSN: 2708-8340