Impact of Sampling Frequency on the Performance of DEVIN: A personal EM UL Exposimeter

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Authors: Mazloum, T.; Bories, S.; Dassonville, D.; Wiart, J.

Journal title: General Assembly and Scientific Symposium, URSI

Journal number: 35

Journal publisher: IEEE

Published year: 2023

DOI identifier: 10.23919/URSIGASS57860.2023.10265631

ISSN: 2642-4339