Single Event Effects in 3.3 kV 4H-SiC MOSFETs due to MeV Ion Impact

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Zimo Yuan, Jang Kwon Lim, Alex Metreveli, Hithiksha Krishna Murthy, Mietek Bakowski, Anders Hallén

Journal title: Solid State Phenomena

Journal number: 361

Journal publisher: Trans Tech Publications, Ltd.

Published year: 2024

DOI identifier: 10.4028/p-90Xrjk

ISSN: 1662-9779