Investigation of Threshold Voltage Instability and Bipolar Degradation in 3.3 kV Conventional Body Diode and Embedded SBD SiC MOSFET

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Authors: Hithiksha Krishna Murthy, Jang Kwon Lim, Mietek Bakowski

Journal title: Solid State Phenomena

Journal number: 361

Journal publisher: Trans Tech Publications, Ltd.

Published year: 2024

DOI identifier: 10.4028/p-HoOFQ0

ISSN: 1662-9779