Temperature dependent trap characterisation and modelling of silicon carbide MOS capacitor

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Authors: Jinglin Li, Sten Vollebregt, Yaqian Zhang, Aditya Shekhar, Alexander May, Willem D. Van Driel, Guoqi Zhang

Journal title: 2024 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)

Journal publisher: IEEE

Published year: 2024

DOI identifier: 10.1109/EuroSimE60745.2024.10491433