Summary
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Authors: R. Vilalta, F. J. Vlchez, Ll. Gifre, C. Manso, J.L. Carcel-Cervera, R. Leira, J. Aracil-Rico, J.P. Fernndez-Palacios, R. Martnez, R. Casellas, R. Muoz
Journal title: IEEE Explore
Journal publisher: IEEE
Published year: 2024