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Authors: Annalisa Franco, Frøy Løvåsdal, Davide Maltoni
Journal title: 2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)
Journal publisher: IEEE
Published year: 2024
Published pages: 531-536
DOI identifier: 10.1109/metroxraine58569.2023.10405682