Unified Face Image Quality Score Based on ISOIEC Quality Components

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Authors: Praveen Kumar Chandaliya, Kiran Raja, Raghavendra Ramachandra, Christoph Busch

Journal title: 2023 International Conference of the Biometrics Special Interest Group (BIOSIG)

Journal publisher: IEEE

Published year: 2023

Published pages: 1-6

DOI identifier: 10.1109/biosig58226.2023.10345988