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Authors: Idan Yaniv, Dan Tsafrir
Journal title: Proceedings of the 2016 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Science - SIGMETRICS '16
Journal publisher: ACM Press
Published year: 2016
Published pages: 337-350
DOI identifier: 10.1145/2896377.2901456
ISBN: 9781-450342667