Summary
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Authors: Luis Luengo-Baranguan, Marcos Remiro-Cinca, David Rivas-Ascaso, Roberto Rocca, Gregorio Fernández, Lorena Elorza-Uriarte
Journal publisher: Institute of Electrical and Electronics Engineers (IEEE)
Published year: 2024
DOI identifier: 10.36227/techrxiv.171387692.26381617/v2
ISSN: 2994-9467