Guideline for Method and Protocol Standardization

Developing and even established nanometrology techniques require data treatment that can often be quite involved and requiring userintervention Choosing a dissolvedNM cutoff value during spICPMS data treatment is an example This kind of expert involvement is best minimized to arrive at consistent verifiable measurands that are intercomparable with each other and with similar measurands to be used in modelling and for longer term integration goals such as standardization of particular techniques into an integrated testing strategy Such activities require development of optimal objective data treatment techniques for several nanometrology techniques used within ACENano and other NSC projects which will also form an important part of the standardization efforts and user guidance