Preparation of Nanoparticles for ToF-SIMS and XPS Analysis

Summary

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Authors: Francesca Bennet, Anja Müller, Jörg Radnik, Yves Hachenberger, Harald Jungnickel, Peter Laux, Andreas Luch, Jutta Tentschert

Journal title: Journal of Visualized Experiments

Journal number: 163

Journal publisher: MYJoVE Corporation

Published year: 2020

DOI identifier: 10.3791/61758

ISSN: 1940-087X