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Authors: Ioannis Sarridis, Christos Koutlis, Symeon Papadopoulos, Christos Diou
Journal title: IEEE Transactions on Pattern Analysis and Machine Intelligence
Journal number: 47
Journal publisher: Institute of Electrical and Electronics Engineers (IEEE)
Published year: 2025
DOI identifier: 10.1109/TPAMI.2024.3487254
ISSN: 0162-8828